A method for estimating the complex residual errors of a VNA in one-port measurements

Author

Kim, Jeong-Hwan ; Kang, Jin-Seob ; Kim, Dae-Chan

Author_Institution

Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea

fYear

2009

Firstpage

1

Lastpage

8

Abstract

This paper presents a method using multiple air lines for estimating the complex residual errors of a VNA (vector network analyzer) being calibrated by an dasiaOSLpsila (open-short-load) technique, which is widely used for one-port measurements. It uses a simple circle fit algorithm, together with some techniques to be used for improving the accuracy in finding the center and radius of a circle in the complex (reflection coefficient) plane from measured calibration data.

Keywords

calibration; measurement errors; microwave measurement; network analysers; reflection; complex residual error estimation; measured calibration data; multiple air lines; one-port measurements; open-short-load; reflection coefficient; simple circle fit algorithm; vector network analyzer; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Frequency measurement; Loss measurement; Magnetic field measurement; NIST; Permittivity measurement; Resonance; Tellurium;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference, 2009 73rd ARFTG

Conference_Location

Boston, MA

Print_ISBN

978-1-4244-3442-8

Electronic_ISBN

978-1-4244-3443-5

Type

conf

DOI

10.1109/ARFTG.2009.5278068

Filename

5278068