DocumentCode :
1644634
Title :
Inter-hierarchical power analysis methodology to reduce multiple orders of magnitude run-time without compromizing accuracy
Author :
Nan, Haiqing ; Choi, Ken
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear :
2009
Firstpage :
556
Lastpage :
559
Abstract :
Now, it is very common to require more than ten engineering-change-order (ECO) iterations to sign-off VLSI design in scaled technologies because engineers should close not only circuit speed, but also power. One of the main components of the long turn-around-time for closing power is generating activity files at gate level or at register-transfer-level (RTL) to analyze the power. This paper describes a method to reduce the power-analysis run time multiple orders of magnitude maintaining gate-level power-analysis accuracy. To reduce the run-time dramatically for power analysis, novel activity-propagation and port-mapping algorithms to convert automatically from electronic-system-level (ESL) activity file to RTL vcd (value change dump) file and to gate-level vcd file have been proposed. After obtaining all vcd files in each level, we can do power analysis without accuracy degradation at RTL and at gate level. In this method, a huge amount of run time for simulation in each level is reduced. By analyzing a variety of digital circuits, we demonstrate the run-time of our methodology is an order of magnitude faster than traditional method at RTL and multiple orders of magnitude faster at gate level with less than 1% accuracy degradation of RTL and gate-level power analysis.
Keywords :
integrated circuit design; logic design; VLSI design; activity propagation algorithm; digital circuits; electronic system level activity; gate level power analysis accuracy; inter-hierarchical power analysis methodology; port mapping algorithm; register transfer level; value change dump file; Algorithm design and analysis; Circuits; Computational modeling; Degradation; Design engineering; Humans; Personal digital assistants; Power engineering and energy; Runtime; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference (ISOCC), 2009 International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5034-3
Electronic_ISBN :
978-1-4244-5035-0
Type :
conf
DOI :
10.1109/SOCDC.2009.5423822
Filename :
5423822
Link To Document :
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