• DocumentCode
    1644654
  • Title

    Automated and precise dielectric measurement systems at millimeter wavelengths using open resonator technique

  • Author

    Gui, Y.F. ; Dou, W.B. ; Yin, K. ; Su, P.G.

  • Author_Institution
    State Key Lab. of MMW, Southeast Univ., Nanjing
  • fYear
    2008
  • Firstpage
    66
  • Lastpage
    69
  • Abstract
    As low loss dielectric materials, ZnS, MgAl2O4 and MgF2 have a very important application in the millimeter-wave frequency range. However, there is little information about their dielectric properties in the millimeter-wave regions. To obtain their dielectric properties, an automatic open resonator measurement system at Ka-band is designed and constructed. The method of multi-frequency points measurement with frequency variation technique is adopted in order to realize the precision determination of cavity length over a broad band. After the checking of repeatability, credibility, reliability and stability, the stability and high accuracy of the measurement system are ensured. It is called certified measurement system and is used to measure the above materials. The results of lots of measurement show that the standard deviation of measurement error is less than 0.154% in permittivity and 19.61% in loss tangent. Meanwhile, some experimental summaries on the open resonator technique are provided. Software that controls the measurement systems is developed and it improves greatly the measurement efficiency.
  • Keywords
    dielectric measurement; dielectric resonators; millimetre waves; permittivity; resonators; dielectric measurement systems; millimeter wavelengths; millimeter-wave frequency range; open resonator; permittivity; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Software measurement; Stability; Zinc compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Millimeter Waves, 2008. GSMM 2008. Global Symposium on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-1885-5
  • Electronic_ISBN
    978-1-4244-1886-2
  • Type

    conf

  • DOI
    10.1109/GSMM.2008.4534559
  • Filename
    4534559