DocumentCode :
1644709
Title :
Multi-line TRL calibration compared to a general de-embedding method
Author :
Ferndahl, Mattias ; Andersson, Kristoffer ; Fager, Christian
Author_Institution :
Microwave Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
fYear :
2009
Firstpage :
1
Lastpage :
5
Abstract :
A direct comparison between a newly proposed general equivalent-circuit-based de-embedding method and a multi-line TRL calibration is presented. It is shown that the de-embedding method yields corrected/ intrinsic S-parameters with good accuracy when compared to the calibration, even up to 100 GHz hence, validating the de-embedding method. Furthermore, in the de-embedding, different equivalent-circuit models with varying complexity for the embedding network are compared and evaluated.
Keywords :
S-parameters; calibration; equivalent circuits; lumped parameter networks; microwave measurement; transistors; S-parameters; general de-embedding method; multi-line TRL calibration; Calibration; Frequency estimation; Impedance; Joining processes; Laboratories; Microwave theory and techniques; Packaging; Probes; Radio frequency; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference, 2009 73rd ARFTG
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3442-8
Electronic_ISBN :
978-1-4244-3443-5
Type :
conf
DOI :
10.1109/ARFTG.2009.5278070
Filename :
5278070
Link To Document :
بازگشت