A mixed-signal approach for high-speed fully controlled multidimensional load-pull parameters sweep

A mixed-signal approach for ldquoreal-timerdquo, fully-controlled, load-pull parameters sweeps is presented. The proposed approach permits high-speed sweeping of any combination of parameters, e.g. input power and fundamental and/or harmonic source or load termination, enabling at the same time full control of all other source and load terminations provided to the device-under-test. Using this method, a very efficient tool is created for high-speed large-signal device characterization, which can mimic realistic circuit conditions not only for single-tone signals, but also for wide-band complex modulated signals. The capabilities of the realized system are demonstrated by characterizing a NXP Gen 6 LDMOS device.