Title :
Second-order error correction of a calibrated two-port vector network analyzer
Author :
Judaschke, Rolf ; Wübbeler, Gerd ; Elster, Clemens
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
A technique for second-order correction of the system error parameters of a calibrated two-port vector network analyzer (VNA) is described. The method is based on the determination of the complex-valued residual directivity, source match, and reflection tracking by one single reflection measurement at both ports employing a high precision airline terminated by a short. From one additional measurement of the through connection applying partly corrected system error parameters, the second-order corrected transmission tracking and the load match in both directions are calculated. Thus, a complete set of second-order corrected error model parameters is determined resulting in an accuracy enhancement. Furthermore, the differences between first- and second-order error parameters give a measure for the quality of the VNA calibration performed beforehand. Measurement results for a 10-dB attenuator are given and compared with data resulting from reference attenuation measurements.
Keywords :
attenuation measurement; calibration; network analysers; VNA calibration; attenuator; complex-valued residual directivity; reference attenuation measurements; reflection tracking; second-order corrected error model; second-order corrected transmission tracking; second-order error correction; single reflection measurement; source match; two-port vector network analyzer; Attenuation measurement; Calibration; Data mining; Error correction; Frequency estimation; Frequency measurement; Measurement standards; Measurement uncertainty; Performance evaluation; Reflection;
Conference_Titel :
Microwave Measurement Conference, 2009 73rd ARFTG
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3442-8
Electronic_ISBN :
978-1-4244-3443-5
DOI :
10.1109/ARFTG.2009.5278080