Title :
Live electrooptic imaging of K-band switching actions and parasitic phenomena in MMIC module
Author :
Tsuchiya, Masahiro ; Shiozawa, Takahiro
Author_Institution :
Nat. Inst. of Inf. & Commun. Technol., Tokyo, Japan
Abstract :
It has been successfully demonstrated that K-band signal behaviors in a monolithic microwave integrated circuits (MMIC) module can be visually observed and analyzed. The visual observations and analyses were performed experimentally by the live electrooptic imaging technique. The module consists of three radio-frequency ports and a MMIC chip of DC-50 GHz single pole double throw switch. Its basic switching actions were visualized clearly while the following parasitic phenomena were visually captured; cavity resonances, their dependences on the module operation modes, and coupling between the input and output lines.
Keywords :
MMIC; cavity resonators; coupled circuits; electro-optical effects; electro-optical switches; integrated circuit packaging; integrated optoelectronics; microwave photonics; microwave switches; modules; K-band signal behavior; K-band switching action; MMIC chip module; cavity resonance; frequency 50 GHz; input line coupling; live electrooptic imaging; module operation mode; monolithic microwave integrated circuit; output line coupling; parasitic phenomena; radiofrequency port module; single pole double throw switch; visual observation; Cavity resonators; Electrooptical waveguides; MMICs; Optical switches; Ports (Computers); Radio frequency; Visualization; electrooptic effect; imaging; integrated circuit packaging; microwave measurements; microwave photonics;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2302-4
Electronic_ISBN :
978-2-87487-026-2
