Fast eye diagram determination for the signal integrity verification of frequency-variant transmission lines

Author

Kim, Hyunsik ; Kim, Dongchul ; Eo, Yungseon

Author_Institution

Dept. of Electr. & Comput. Eng., Hanyang Univ., Ansan, South Korea

fYear

2009

Firstpage

436

Lastpage

439

Abstract

A new efficient and accurate eye diagram determination technique is presented. In order to estimate the worst case eye diagram, bit streams which may induce the worst ISI (inter symbol interference) are determined. Then the output responses for worst case bit streams are determined by using fast Fourier transform technique. The proposed technique is compared with SPICE simulation that employs PRBS (pseudorandom bit sequence) input signals.

Keywords

fast Fourier transforms; intersymbol interference; logic design; random sequences; bit stream; fast Fourier transform; fast eye diagram determination; frequency-variant transmission lines; inter symbol interference; pseudorandom bit sequence; signal integrity verification; Bismuth; Fast Fourier transforms; Frequency domain analysis; Frequency estimation; Intersymbol interference; SPICE; Semiconductor process modeling; Signal analysis; Transient response; Transmission lines; Eye-diagram; frequency-variant characteristics; signal integrity; signal transient response; transmission line;

fLanguage

English

Publisher

ieee

Conference_Titel

SoC Design Conference (ISOCC), 2009 International

Conference_Location

Busan

Print_ISBN

978-1-4244-5034-3

Electronic_ISBN

978-1-4244-5035-0

Type

conf

DOI

10.1109/SOCDC.2009.5423860

Filename

5423860