Title :
The impact of terrestrial radiation effects on the reliability of a smart grid
Author :
Yao, Xiaoyin ; Ni, Hui ; Vera, G. Alonzo
Abstract :
This paper analyzes the impact of terrestrial radiation effects on the reliability of a Smart Grid. The mechanisms of radiation effects on semiconductor devices are briefly introduced and mitigation techniques are presented. Since this is a new research area, the future directions in it are discussed.
Keywords :
power system reliability; radiation effects; smart power grids; mitigation techniques; semiconductor devices; smart grid reliability; terrestrial radiation effects; Power system reliability; Radiation effects; Reliability; Semiconductor devices; Sensors; Smart grids; radiation effects; reliability; smart grid; terrestrial radiation;
Conference_Titel :
Innovative Smart Grid Technologies (ISGT), 2012 IEEE PES
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4577-2158-8
DOI :
10.1109/ISGT.2012.6175821
