DocumentCode :
1645855
Title :
Self-test scheduling with bounded test execution time
Author :
Stroele, Albrecht P.
fYear :
1995
Firstpage :
130
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Hardware; Logic testing; Registers; Scheduling; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-0760-7
Type :
conf
DOI :
10.1109/TEST.1992.527813
Filename :
527813
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1645855
