Title : 
High Performance Dual Recess 0.15-μm pHEMT for Multi-Function MMIC Applications
         
        
            Author : 
Kao, Ming-Yih ; Nayak, Sabyasachi ; Hajji, Rached ; Hillyard, Sean E. ; Ketterson, Andrew A.
         
        
            Author_Institution : 
TriQuint Semicond., Richardson, TX
         
        
        
        
        
            Abstract : 
This paper describes a dual recess 0.15-μm gate length pseudomorphic high electron mobility transistor (pHEMT) technology for multi-function MMIC applications at microwave and millimeter-wave frequencies. This 0.15-μm power pHEMT not only produces high efficiency power amplification at Ka- and Q-band but also exhibits excellent noise and third-order-intercept (TOI) performance. At 35 GHz, output power density of 0.86 W/mm, power gain of 5.6 dB, and power-added efficiencies of 38 to 44 % were demonstrated. Low noise figure of 1.0 dB at 26 GHz was also measured. Additionally, we have demonstrated a gain of 11.7 dB and a TOI of 35 dBm at 18 GHz for a 300-μm unit cell. This microwave device technology is suitable for producing high performance power amplifier, low noise receiver, high linearity, transmit/receive and multi-function MMICs.
         
        
            Keywords : 
MMIC; microwave amplifiers; power HEMT; power amplifiers; 0.15 micron; 1.0 dB; 11.7 dB; 18 GHz; 26 GHz; 300 micron; 35 GHz; 5.6 dB; Ka-band; MMIC; Q-band; high efficiency power amplification; low noise receiver; microwave device technology; microwave frequencies; millimeter-wave frequencies; noise figure; pHEMT; power amplifier; pseudomorphic high electron mobility transistor; Electron mobility; Gain; HEMTs; MMICs; MODFETs; Microwave technology; Microwave transistors; Millimeter wave technology; Millimeter wave transistors; PHEMTs; Kaband; Q-band; TOI; component; low noise; pHEMT;
         
        
        
        
            Conference_Titel : 
Compound Semiconductor Integrated Circuit Symposium, 2006. CSIC 2006. IEEE
         
        
            Conference_Location : 
San Antonio, TX
         
        
            Print_ISBN : 
1-4244-0126-7
         
        
            Electronic_ISBN : 
1-4244-0127-5
         
        
        
            DOI : 
10.1109/CSICS.2006.319920