Title : 
Quick Thermal Evaluation Software for GaAs Power MESFET´s
         
        
            Author : 
Rawal, D.S. ; Dhanotia, Abhishek
         
        
            Author_Institution : 
Solid State Phys. Lab., Delhi
         
        
        
        
        
            Abstract : 
Two analytical solutions for calculating thermal resistance are studied and a MATLAB based quick thermal evaluation software is developed to calculate thermal parameters of GaAs based power MESFET with known geometrical parameters. The software computes thermal resistance and channel temperature and also generates contour plots for temperature profiles along the surface and substrate of the FET. The thermal parameter estimation was revalidated on commercially available GaAs power device from commercial foundry and the valves of thermal resistance and channel temperature are in close agreement with the practically measured values. The software requires minimal computing resources and capable of running on any platform which supports MATLAB. The software can be used during the initial process of device development for deriving some critical conclusions important for efficient device heat management
         
        
            Keywords : 
III-V semiconductors; gallium arsenide; mathematics computing; power MESFET; power field effect transistors; thermal resistance; GaAs; MATLAB; MMIC; channel temperature; device heat management; geometrical parameters; power FET; power MESFET; quick thermal evaluation software; thermal parameter estimation; thermal parameters; thermal resistance; FETs; Foundries; Gallium arsenide; MATLAB; MESFETs; Parameter estimation; Surface resistance; Temperature; Thermal resistance; Valves; GaAs; MMIC; power FETs; thermal resistance;
         
        
        
        
            Conference_Titel : 
Compound Semiconductor Integrated Circuit Symposium, 2006. CSIC 2006. IEEE
         
        
            Conference_Location : 
San Antonio, TX
         
        
            Print_ISBN : 
1-4244-0126-7
         
        
            Electronic_ISBN : 
1-4244-0127-5
         
        
        
            DOI : 
10.1109/CSICS.2006.319927