1646088

Can concurrent checkers help BIST?

Gupta, Sandeep K. ; Pradhan, Dhiraj K.

1995

140

Availability; Built-in self-test; Circuit testing; Concurrent computing; Costs; Design methodology; Fault diagnosis; Fault tolerant systems; Hardware; Very large scale integration;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527814

527814