DocumentCode
1646134
Title
Immunity testing on extended systems
Author
Bardsley, D.J.
Author_Institution
Dept. of Reactor Services, Sensors & Instrum., AEA Technol.,, Warrington, UK
fYear
1993
fDate
9/21/1993 12:00:00 AM
Firstpage
42522
Lastpage
42528
Abstract
The immunity to electrical interference of an extended system, where transducers and signal processors are separated but in electrical contact, is frequently worse than that of its constituent parts. For small systems it may be possible to carry out tests in the laboratory but may be more practical to conduct tests at the manufacturers works or at the installation. In practice, system immunity will degrade with time and on-site testing can establish immunity performance levels and indicate degradation trends. The author describes the test system
Keywords
electromagnetic compatibility; electromagnetic interference; electronic equipment testing; standards; test equipment; test facilities; EMC; degradation trends; electrical interference; electromagnetic compatibility; extended systems; performance levels; signal processors; susceptibility; system immunity; testing; transducers;
fLanguage
English
Publisher
iet
Conference_Titel
Low Cost EMC Testing, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
274490
Link To Document