Title :
Performance limits in visible and infrared imager sensors
Author :
Kozlowski, L.J. ; Luo, J. ; Tomasini, A.
Author_Institution :
Sci. Center, Rockwell Int. Corp., Thousand Oaks, CA, USA
Abstract :
Emerging CMOS image sensors are fundamentally superior to CCD imagers with respect to read noise and sensitivity at video data rates. We discuss each technology´s performance limits, show that CMOS´s advantages increase with the number of pixels, report supporting data and conclude that CMOS will likely supplant CCDs for megapixel imagers. CCDs can perform at their theoretical limit with minimum read noise of /spl sim/1 e- at 20 kHz data rate and 10-20 e- at /spl sim/10 MHz. CMOS-based image sensors, on the other hand, can provide higher sensitivity and lower read noise at /spl ges/10 MHz via pixel-based amplification and narrow noise bandwidth.
Keywords :
CCD image sensors; CMOS image sensors; optical noise; sensitivity; CCD imagers; CMOS-based image sensors; emerging CMOS image sensors; higher sensitivity; infrared imager sensors; kHz data rate; lower read noise; megapixel imagers; minimum read noise; narrow noise bandwidth; performance limits; pixel number; pixel-based amplification; read noise; sensitivity; video data rates; visible imager sensors; Bandwidth; CMOS image sensors; CMOS technology; Charge coupled devices; Charge-coupled image sensors; Electrons; Infrared image sensors; Pixel; Sensor arrays; Voltage;
Conference_Titel :
Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5410-9
DOI :
10.1109/IEDM.1999.824286