• DocumentCode
    1646322
  • Title

    IDDQ TESTING IN CMOS DIGITAL ASIC´S - PUTTING IT ALL TOGETHER

  • Author

    Perry, Roger

  • fYear
    1992
  • Firstpage
    151
  • Keywords
    Application specific integrated circuits; Automatic testing; CMOS technology; Circuit faults; Clocks; Current measurement; Electronics packaging; Failure analysis; Latches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527815
  • Filename
    527815
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1646322