DocumentCode :
1646347
Title :
RAD and Quality - a practitioner´s view
Author :
John, Thomas
fYear :
1995
fDate :
12/11/1995 12:00:00 AM
Firstpage :
42461
fLanguage :
English
Publisher :
iet
Conference_Titel :
Will Tickit and ISO 9000 Survive Rapid Application Development?, IEE Colloquium on
Conference_Location :
IET
Type :
conf
Filename :
498916
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1646347
