DocumentCode
1646503
Title
Effects of water absorption on interfacial phenomena in HV insulating materials
Author
Ezoe, Minoru ; Tada, Masataka ; Nakanisi, Masaru
Author_Institution
Nitto Denko Corp., Mie, Japan
Volume
1
fYear
1997
Firstpage
376
Abstract
Dielectric properties of filled epoxy resins were measured after water attack at 50°C and after HF vapors attack. The loss tangent tan δ of these composites showed tendency to increase rapidly from moisture content 0.6%. But roundish filled resin didn´t show the phenomena to increase rapidly, and this tan δ increased only a little. The filler particle size and the filler material in filled resin had a little influence on the phenomena. The same was true of the case that roundish silica filled resins were exposed in HF vapor, that is to say, this tan δ had a little increase in comparison with square silica filled resins. These results should be understood that the water entered into the bulk along the interfaces between filler and epoxy resin. We could obtain the lower loss tangent epoxy resin castings through the roundish silica filler
Keywords
composite insulating materials; composite material interfaces; dielectric losses; environmental degradation; epoxy insulation; filled polymers; interface phenomena; sorption; water; 50 C; HF; HF vapor attack; HV insulating material; SiO2; composite; dielectric properties; interfacial phenomena; loss tangent; moisture; silica filled epoxy resin; water absorption; Absorption; Amorphous materials; Dielectric losses; Dielectric measurements; Epoxy resins; Hafnium; Insulation; Moisture; Silicon compounds; Water storage;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location
Seoul
Print_ISBN
0-7803-2651-2
Type
conf
DOI
10.1109/ICPADM.1997.617609
Filename
617609
Link To Document