• DocumentCode
    1646503
  • Title

    Effects of water absorption on interfacial phenomena in HV insulating materials

  • Author

    Ezoe, Minoru ; Tada, Masataka ; Nakanisi, Masaru

  • Author_Institution
    Nitto Denko Corp., Mie, Japan
  • Volume
    1
  • fYear
    1997
  • Firstpage
    376
  • Abstract
    Dielectric properties of filled epoxy resins were measured after water attack at 50°C and after HF vapors attack. The loss tangent tan δ of these composites showed tendency to increase rapidly from moisture content 0.6%. But roundish filled resin didn´t show the phenomena to increase rapidly, and this tan δ increased only a little. The filler particle size and the filler material in filled resin had a little influence on the phenomena. The same was true of the case that roundish silica filled resins were exposed in HF vapor, that is to say, this tan δ had a little increase in comparison with square silica filled resins. These results should be understood that the water entered into the bulk along the interfaces between filler and epoxy resin. We could obtain the lower loss tangent epoxy resin castings through the roundish silica filler
  • Keywords
    composite insulating materials; composite material interfaces; dielectric losses; environmental degradation; epoxy insulation; filled polymers; interface phenomena; sorption; water; 50 C; HF; HF vapor attack; HV insulating material; SiO2; composite; dielectric properties; interfacial phenomena; loss tangent; moisture; silica filled epoxy resin; water absorption; Absorption; Amorphous materials; Dielectric losses; Dielectric measurements; Epoxy resins; Hafnium; Insulation; Moisture; Silicon compounds; Water storage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-2651-2
  • Type

    conf

  • DOI
    10.1109/ICPADM.1997.617609
  • Filename
    617609