DocumentCode :
1646504
Title :
Ultra-high purity gas distribution systems for sub 0.5 μm ULSI manufacturing
Author :
Cheung, Steven D. ; Jensen, David L. ; Mooney, Geoffrey L.
Author_Institution :
Digital Semiconductor, Hudson, MA, USA
fYear :
1994
Firstpage :
107
Lastpage :
111
Abstract :
Details from the design, installation, and certification of a novel, zero deadspace, continuous flow, facility gas distribution and monitoring system, and its initial commissioning results are presented. The system as described has been implemented on the N2, O2, He, and Ar supply lines at Digital Semiconductor´s Fab 6 in Hudson, MA. Ultra-high purity (UHP) gases supplied via these systems have demonstrated guaranteed performance specifications of <1 part-per-billion (ppb), for individual contaminants, to the tool hook-up point-of-connect (POC). Digital Semiconductor adopted this design to supply ultra-high purity gases to processing equipment in support of three successive generations of sub 0.5 μm ULSI semiconductor development and production. Proposed advantages of the design include reduced contaminant accumulation and intrusion with improved purgability, maintainability, and upset monitoring. Results presented detail system start-up and baselining, including data at tool hook-up POC
Keywords :
ULSI; 0.5 micron; Ar; He; N2; O2; ULSI manufacturing; certification; continuous flow; installation; monitoring system; sub half micron manufacturing; ultra-high purity gas distribution systems; zero deadspace; Argon; Costs; Gases; Helium; Impurities; Manufacturing; Monitoring; Semiconductor device manufacture; Steel; Ultra large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop. 1994 IEEE/SEMI
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-2053-0
Type :
conf
DOI :
10.1109/ASMC.1994.588212
Filename :
588212
Link To Document :
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