DocumentCode
1646504
Title
Ultra-high purity gas distribution systems for sub 0.5 μm ULSI manufacturing
Author
Cheung, Steven D. ; Jensen, David L. ; Mooney, Geoffrey L.
Author_Institution
Digital Semiconductor, Hudson, MA, USA
fYear
1994
Firstpage
107
Lastpage
111
Abstract
Details from the design, installation, and certification of a novel, zero deadspace, continuous flow, facility gas distribution and monitoring system, and its initial commissioning results are presented. The system as described has been implemented on the N2, O2, He, and Ar supply lines at Digital Semiconductor´s Fab 6 in Hudson, MA. Ultra-high purity (UHP) gases supplied via these systems have demonstrated guaranteed performance specifications of <1 part-per-billion (ppb), for individual contaminants, to the tool hook-up point-of-connect (POC). Digital Semiconductor adopted this design to supply ultra-high purity gases to processing equipment in support of three successive generations of sub 0.5 μm ULSI semiconductor development and production. Proposed advantages of the design include reduced contaminant accumulation and intrusion with improved purgability, maintainability, and upset monitoring. Results presented detail system start-up and baselining, including data at tool hook-up POC
Keywords
ULSI; 0.5 micron; Ar; He; N2; O2; ULSI manufacturing; certification; continuous flow; installation; monitoring system; sub half micron manufacturing; ultra-high purity gas distribution systems; zero deadspace; Argon; Costs; Gases; Helium; Impurities; Manufacturing; Monitoring; Semiconductor device manufacture; Steel; Ultra large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop. 1994 IEEE/SEMI
Conference_Location
Cambridge, MA
Print_ISBN
0-7803-2053-0
Type
conf
DOI
10.1109/ASMC.1994.588212
Filename
588212
Link To Document