• DocumentCode
    1646902
  • Title

    CVD Diamond - The Next Generation Electronic Material

  • Author

    Kohn, Erhard ; Denisenko, Andrej

  • Author_Institution
    Dept. of Electron Devices & Circuits, Ulm Univ.
  • fYear
    2006
  • Firstpage
    247
  • Lastpage
    252
  • Abstract
    The status of diamond electronic device structures for high power, high temperature and high frequency is reviewed and latest data are highlighted. First results on the operation in harsh environment and very high temperature suggest that besides the power handling capability, the stability, robustness and reliability may be superior to that of all other semiconductors
  • Keywords
    chemical vapour deposition; diamond; semiconductor materials; CVD diamond; diamond electronic device structures; electronic material; power handling capability; Boron; Cutoff frequency; Doping; Electric breakdown; FETs; Plasma temperature; Robust stability; Schottky diodes; Substrates; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium, 2006. CSIC 2006. IEEE
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    1-4244-0126-7
  • Electronic_ISBN
    1-4244-0127-5
  • Type

    conf

  • DOI
    10.1109/CSICS.2006.319946
  • Filename
    4110033