• DocumentCode
    1647031
  • Title

    Determining the HBT base-collector elements directly from S-parameter data

  • Author

    Wasige, E.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1019
  • Abstract
    This paper gives suitable analytic equations for direct extraction of the heterojunction bipolar transistor (HBT) series base resistance R/sub bi/ and base-collector capacitances (C/sub bci/ and C/sub bcx/), elements which determine the transistor maximum oscillation frequency f/sub max/. New expressions, one for R/sub bi/, and the other relating R/sub bi/ and C/sub bcx/ in terms of measured parameters have been developed. On this basis, direct extraction of the inner C/sub bci/ and outer C/sub bcx/ base-collector capacitances is possible, independently and robustly. All expressions are valid at each measured frequency, a useful feature in the control of extraction quality.
  • Keywords
    S-parameters; capacitance; electric resistance; heterojunction bipolar transistors; microwave bipolar transistors; semiconductor device models; HBT HF performance; HBT base-collector elements; S-parameter data; base-collector capacitances; direct extraction; heterojunction bipolar transistor; high frequency performance; series base resistance; transistor maximum oscillation frequency; Capacitance; Data mining; Electric resistance; Electrical resistance measurement; Equations; Equivalent circuits; Frequency; Heterojunction bipolar transistors; Robustness; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1212542
  • Filename
    1212542