DocumentCode :
1647031
Title :
Determining the HBT base-collector elements directly from S-parameter data
Author :
Wasige, E.
Author_Institution :
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
Volume :
2
fYear :
2003
Firstpage :
1019
Abstract :
This paper gives suitable analytic equations for direct extraction of the heterojunction bipolar transistor (HBT) series base resistance R/sub bi/ and base-collector capacitances (C/sub bci/ and C/sub bcx/), elements which determine the transistor maximum oscillation frequency f/sub max/. New expressions, one for R/sub bi/, and the other relating R/sub bi/ and C/sub bcx/ in terms of measured parameters have been developed. On this basis, direct extraction of the inner C/sub bci/ and outer C/sub bcx/ base-collector capacitances is possible, independently and robustly. All expressions are valid at each measured frequency, a useful feature in the control of extraction quality.
Keywords :
S-parameters; capacitance; electric resistance; heterojunction bipolar transistors; microwave bipolar transistors; semiconductor device models; HBT HF performance; HBT base-collector elements; S-parameter data; base-collector capacitances; direct extraction; heterojunction bipolar transistor; high frequency performance; series base resistance; transistor maximum oscillation frequency; Capacitance; Data mining; Electric resistance; Electrical resistance measurement; Equations; Equivalent circuits; Frequency; Heterojunction bipolar transistors; Robustness; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1212542
Filename :
1212542
Link To Document :
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