Title :
Effects of defects on dielectric breakdown phenomena and life time of polymeric insulation
Author :
Cho, Young-Shin ; Park, Jang-Ho ; Shim, Mi-Ja ; Kim, Sang-Wook
Author_Institution :
Dept. of Chem. Eng., Seoul City Univ., South Korea
Abstract :
Effects of defects on dielectric breakdown phenomena and life time of PE insulation were investigated. Volatile impurity was observed by FT-IR spectrum and oxidation reaction was faster on Cu than Al open pan. From the artificial impurities such as carbon fiber, nylon, Cu and Al particles, electrical tree started and dielectric breakdown was occurred finally. Space charge formed by the injection of electron from electrode and trapped in impurities acts as the main cause of dielectric breakdown in polymeric insulation
Keywords :
Fourier transform spectra; electric breakdown; impurities; infrared spectra; insulation testing; life testing; oxidation; polyethylene insulation; space charge; trees (electrical); FTIR spectrum; PE; defects; dielectric breakdown; electrical tree; electron injection; lifetime; oxidation; polymeric insulation; space charge; volatile impurities; Dielectric breakdown; Dielectrics and electrical insulation; Electrodes; Electron traps; Impurities; Oxidation; Plastic insulation; Polymers; Space charge; Trees - insulation;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.617632
