Title :
Diagnostic Fault Simulation of Sequential Circuits
Author :
Rudnick, Elizabeth M. ; Fuchs, W. Kent ; Patel, Janak H.
Keywords :
Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault diagnosis; Power measurement; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527818
