DocumentCode
1647160
Title
Leakage power reduction of functional units in processors having zero-overhead loop counter
Author
Park, Hanmin ; Paek, Jong Kyung ; Lee, Jinho ; Choi, Kiyoung
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear
2009
Firstpage
492
Lastpage
495
Abstract
As the semiconductor process advances below 90 nm technology node, leakage power has been an ever more serious concern. One of the most effective ways of reducing leakage power is power gating the circuits. Our work tries to find a micro-architectural way of applying power gating technique to functional units in a processor, while avoiding processor stalls, separate power control instructions, and much hardware overhead. We focus on loops, which typically cause long idle period for some functional units that are not used in the loops. Assuming that the target processor has zero-overhead loop feature, we exploit the existing hardware loop counter to determine when to wake up the functional units that have been turned off with the start of the loop execution. We use our own processor, ODALRISC, synthesized with 45 nm process library and a C compiler to execute several benchmarks and realistic applications and obtain power report. The experimental results show that our approach achieves about 30% leakage power reduction on average in functional units for JPEG applications, with no performance degradation.
Keywords
microprocessor chips; power control; program compilers; C compiler; JPEG; ODALRISC; functional units leakage power reduction; hardware loop counter; hardware overhead; power control instructions; power gating; processors; size 45 nm; size 90 nm; zero-overhead loop counter; CMOS technology; Computer science; Counting circuits; Electronic circuits; Energy consumption; Hardware; Power control; Rails; Sleep; Turning; leakage power; low-power; power gating; zero-overhead loop;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2009 International
Conference_Location
Busan
Print_ISBN
978-1-4244-5034-3
Electronic_ISBN
978-1-4244-5035-0
Type
conf
DOI
10.1109/SOCDC.2009.5423916
Filename
5423916
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