Title :
Eleventh Annual IEEE International High-Level Design Validation and Test Workshop
Abstract :
The following topics are dealt with: high-level design validation; test specification; inductive logic programming; cell-based genetic algorithm; formal verification in modern chip design; and program slicing
Keywords :
formal specification; formal verification; genetic algorithms; inductive logic programming; learning by example; logic design; microprocessor chips; program slicing; cell-based genetic algorithm; formal verification; high-level design validation; inductive logic programming; modern chip design; program slicing; test specification;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0679-X
Electronic_ISBN :
1552-6674
DOI :
10.1109/HLDVT.2006.320000
