Title :
Sequential Redundancy Identification Using Verification Techniques
Author :
Moondanos, John ; Abraham, Jacob
Keywords :
Benchmark testing; Circuit faults; Circuit testing; Drives; Electrical fault detection; Fault diagnosis; Jacobian matrices; Redundancy; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527820
