Title :
New dielectric-covered waveguide-to-microstrip transitions for Ka-band transceivers
Author :
Kang Wook Kim ; Chae-Ho Na ; Dong-Sik Woo
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea
Abstract :
New dielectric-covered waveguide-to-microstrip transitions at Ka-band have been developed. These transitions are probe-type, but the dielectric material completely covers the waveguide opening in order to provide a moisture barrier and robustness. These transitions are also designed to be less sensitive to fabrication tolerances. The transition structures have been comprehensively analyzed using a 3-D EM software. The resonance phenomena caused by the waveguide-wall discontinuity have been removed by placing vias around the waveguide aperture. These transitions have also been fabricated and measured. The measured insertion loss of the transition is less than 0.4 dB and the return loss is about 15 dB over the entire Ka-band.
Keywords :
computational electromagnetics; dielectric materials; microstrip transitions; transceivers; waveguide discontinuities; waveguide transitions; 0.4 dB; 15 dB; 3-D EM software; Ka-band transceivers; dielectric material; dielectric-covered waveguide-to-microstrip transitions; fabrication tolerance sensitivity; insertion loss; moisture barrier; probe-type transitions; resonance phenomena; return loss; robustness; transition structures; vias; waveguide-wall discontinuity; Apertures; Dielectric materials; Fabrication; Loss measurement; Moisture; Resonance; Robustness; Transceivers; Waveguide discontinuities; Waveguide transitions;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1212564