Title :
Liquid crystal polymer-based integrated passive development for RF applications
Author :
Davis, M.F. ; Yoon, S.-W. ; Pinel, S. ; Lim, K. ; Laskar, J.
Author_Institution :
NSF Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A Liquid Crystal Polymer (LCP) based multilayer packaging process is presented for RF/microwave applications. LCP is gaining increasing interest as a choice technology in the packaging community due to its superior thermal and electrical properties including low loss, low dielectric constant and low CTE characteristics. For the first time, we present a thorough study of the design, model, and measurement of integrated passives using LCP. A coplanar waveguide transmission line test structure demonstrates an insertion loss of 0.35 dB at 23 GHz and a return loss better than 15 dB to 30 GHz. Quality factors (Q) in excess of 70 and a self resonance frequency (SRF) to 29 GHz have been achieved. A bandpass filter implementation is also demonstrated to realize a c band module. Advantages of passive integration using built up LCPs as opposed to multilayer organics are discussed.
Keywords :
Q-factor; S-parameters; band-pass filters; coplanar waveguide components; coplanar waveguides; inductors; liquid crystal devices; liquid crystal polymers; microwave filters; microwave integrated circuits; packaging; 0.35 dB; 15 dB; 23 to 30 GHz; RF SOP module; RF applications; S-parameter measurements; bandpass filter implementation; c band module; coplanar LCP spiral inductors; coplanar waveguide transmission line test structure; electrical properties; ground plane spacing; insertion loss; liquid crystal polymer based multilayer packaging process; liquid crystal polymer-based integrated passive development; low CTE characteristics; low dielectric constant; low loss; passive integration; quality factors; return loss; self resonance frequency; thermal properties; Dielectric constant; Dielectric losses; Dielectric measurements; Liquid crystal polymers; Nonhomogeneous media; Packaging; Propagation losses; Radio frequency; Time measurement; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1212573