DocumentCode
1647858
Title
CP with Architectural State Lookup for Functional Test Generation
Author
Gutkovich, B. ; Moss, A.
Author_Institution
Intel Corp., Haifa
fYear
2006
Firstpage
111
Lastpage
118
Abstract
Constraint programming (CP) is a powerful technology that has proved very useful in random functional test generation. On the other hand the complexity of the test generation process prevents it from being represented and solved as a single constraint satisfaction problem (CSP). Developers of test generation tools have to decompose the problem into a set of smaller tasks and to make CP work in interaction with other technologies, e.g. architectural simulator. The task of turning these foreign technologies into an integral part of the CP search algorithm raises multiple challenges. We propose a method for accomplishing this task by means of so called custom constraints, which are based on demons and custom propagation algorithms. We implemented the method in a framework of ILOG Solver and tested it on a use case of the memory address translation mechanism for protected mode of IA-32 processor
Keywords
automatic test pattern generation; constraint handling; ILOG Solver; architectural state lookup; constraint programming search algorithm; constraint satisfaction problem; custom constraint; custom propagation algorithm; memory address translation mechanism; random functional test generation; Computer bugs; Conferences; Functional programming; Maintenance engineering; Power engineering and energy; Power generation; Protection; Registers; Testing; Turning;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International
Conference_Location
Monterey, CA
ISSN
1552-6674
Print_ISBN
1-4244-0679-X
Electronic_ISBN
1552-6674
Type
conf
DOI
10.1109/HLDVT.2006.319972
Filename
4110071
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