• DocumentCode
    1647898
  • Title

    Measurement of junction temperature of a semiconductor laser diode

  • Author

    Karim, Abid

  • Author_Institution
    Dept. of Electron. Eng., NED Univ. of Eng., Karachi, Pakistan
  • fYear
    2004
  • Firstpage
    659
  • Lastpage
    662
  • Abstract
    Normally, laser diodes (LDs) are mounted on heat sinks to dissipate the heat energy to avoid overheating. But even when a laser-diode is mounted on a heat sink; the active layer temperature or junction temperature can rise significantly above the heat sink temperature because of thermal resistance of various layers of a laser diode. Junction temperature affects laser diode performance in many ways. Therefore, the thermal design of a laser diode itself and the packaging in which it is encased becomes crucial to the overall performance of the device. In this paper, a simple technique for the estimation of junction temperature of a semiconductor laser diode is developed. This technique is successfully applied for the measurement of junction temperature of a semiconductor LD.
  • Keywords
    heat sinks; semiconductor device packaging; semiconductor lasers; temperature measurement; active layer temperature; heat sinks; junction temperature measurement; packaging; semiconductor laser diode; thermal design; thermal resistance; Diode lasers; Heat sinks; Power engineering and energy; Power generation; Semiconductor diodes; Temperature dependence; Temperature measurement; Thermal management; Threshold current; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multitopic Conference, 2004. Proceedings of INMIC 2004. 8th International
  • Print_ISBN
    0-7803-8680-9
  • Type

    conf

  • DOI
    10.1109/INMIC.2004.1492970
  • Filename
    1492970