DocumentCode :
1647898
Title :
Measurement of junction temperature of a semiconductor laser diode
Author :
Karim, Abid
Author_Institution :
Dept. of Electron. Eng., NED Univ. of Eng., Karachi, Pakistan
fYear :
2004
Firstpage :
659
Lastpage :
662
Abstract :
Normally, laser diodes (LDs) are mounted on heat sinks to dissipate the heat energy to avoid overheating. But even when a laser-diode is mounted on a heat sink; the active layer temperature or junction temperature can rise significantly above the heat sink temperature because of thermal resistance of various layers of a laser diode. Junction temperature affects laser diode performance in many ways. Therefore, the thermal design of a laser diode itself and the packaging in which it is encased becomes crucial to the overall performance of the device. In this paper, a simple technique for the estimation of junction temperature of a semiconductor laser diode is developed. This technique is successfully applied for the measurement of junction temperature of a semiconductor LD.
Keywords :
heat sinks; semiconductor device packaging; semiconductor lasers; temperature measurement; active layer temperature; heat sinks; junction temperature measurement; packaging; semiconductor laser diode; thermal design; thermal resistance; Diode lasers; Heat sinks; Power engineering and energy; Power generation; Semiconductor diodes; Temperature dependence; Temperature measurement; Thermal management; Threshold current; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multitopic Conference, 2004. Proceedings of INMIC 2004. 8th International
Print_ISBN :
0-7803-8680-9
Type :
conf
DOI :
10.1109/INMIC.2004.1492970
Filename :
1492970
Link To Document :
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