DocumentCode
1647898
Title
Measurement of junction temperature of a semiconductor laser diode
Author
Karim, Abid
Author_Institution
Dept. of Electron. Eng., NED Univ. of Eng., Karachi, Pakistan
fYear
2004
Firstpage
659
Lastpage
662
Abstract
Normally, laser diodes (LDs) are mounted on heat sinks to dissipate the heat energy to avoid overheating. But even when a laser-diode is mounted on a heat sink; the active layer temperature or junction temperature can rise significantly above the heat sink temperature because of thermal resistance of various layers of a laser diode. Junction temperature affects laser diode performance in many ways. Therefore, the thermal design of a laser diode itself and the packaging in which it is encased becomes crucial to the overall performance of the device. In this paper, a simple technique for the estimation of junction temperature of a semiconductor laser diode is developed. This technique is successfully applied for the measurement of junction temperature of a semiconductor LD.
Keywords
heat sinks; semiconductor device packaging; semiconductor lasers; temperature measurement; active layer temperature; heat sinks; junction temperature measurement; packaging; semiconductor laser diode; thermal design; thermal resistance; Diode lasers; Heat sinks; Power engineering and energy; Power generation; Semiconductor diodes; Temperature dependence; Temperature measurement; Thermal management; Threshold current; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Multitopic Conference, 2004. Proceedings of INMIC 2004. 8th International
Print_ISBN
0-7803-8680-9
Type
conf
DOI
10.1109/INMIC.2004.1492970
Filename
1492970
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