DocumentCode
164791
Title
A low power DRAM refresh control scheme for 3D memory cube
Author
Ying Wang ; Yinhe Han ; Huawei Li
Author_Institution
SKL of Comput. Archit., Inst. of Comput. Technol., Beijing, China
fYear
2014
fDate
14-16 April 2014
Firstpage
1
Lastpage
3
Abstract
We propose a low power refresh control scheme for 3D stacked DRAM memory, which leverages the data-pattern dependence characteristics of the cells´ Retention-Time to squeeze the margin of refresh interval. It is a systematic approach that uses our proposed Retention-Time (RT) detection mechanism to capture the bottleneck that contributes to over-frequent refresh operations: “weak” cells with relatively shorter Retention-Time than others. With the help of memory scrubbers and Error Correction Pointer (ECP) table integrated on logic base of 3D memory cube, we can avoid the worst-case operation by locating the true “weak” cells sensitized by application and adapting the refresh rate to the data layout under our loop-based control algorithm. As shown in experiments, the method dramatically saves memory energy and bandwidth consumption.
Keywords
DRAM chips; error correction; integrated circuit testing; low-power electronics; three-dimensional integrated circuits; 3D memory cube; 3D stacked DRAM memory; ECP; RT detection mechanism; bandwidth consumption; data layout; data-pattern dependence characteristics; error correction pointer; logic base; loop-based control algorithm; low power DRAM refresh control scheme; memory energy; memory scrubbers; refresh interval; retention-time detection mechanism; 3D Stacked DRAM; Retention Time and Refresh;
fLanguage
English
Publisher
ieee
Conference_Titel
COOL Chips XVII, 2014 IEEE
Conference_Location
Yokohama
Type
conf
DOI
10.1109/CoolChips.2014.6842950
Filename
6842950
Link To Document