Title :
Object recognition in ocean imagery using feature selection and compressive sensing
Author :
Rainey, Katie ; Stastny, John
Author_Institution :
SPAWAR Syst. Center Pacific, San Diego, CA, USA
Abstract :
Ship recognition and classification in electro-optical satellite imagery is a challenging problem with important military applications. The problem is similar to that of face recognition, but with many unique considerations. A ship´s appearance can vary dramatically from image to image depending on factors such as lighting condition, sensor angle, and ocean state, and there is often wide variation between ships of the same class. Collecting and labeling sufficient training data is another challenge. We consider how appropriate feature selection and description can assist in addressing these challenges. Our proposed algorithm for vessel classification combines shape invariant features such as SIFT with a well known face recognition algorithm from the theory of sparse representation and compressive sensing. We demonstrate improved classification accuracy using invariant features at significant key points instead of random features to represent images. We also discuss how algorithms such as this are currently implemented to detect and classify ships and other objects in ocean imagery.
Keywords :
face recognition; feature extraction; image classification; image representation; learning (artificial intelligence); naval engineering computing; object recognition; ships; SIFT; compressive sensing; electro-optical satellite imagery; face recognition; feature selection; image representation; lighting condition; object recognition; ocean imagery; ocean state; scale invariant feature transform; sensor angle; ship appearance; ship classification; ship recognition; sparse representation; training data collection; training data labeling; vessel classification; Accuracy; Face recognition; Marine vehicles; Support vector machines; Training; Vectors; Vocabulary;
Conference_Titel :
Applied Imagery Pattern Recognition Workshop (AIPR), 2011 IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0215-9
DOI :
10.1109/AIPR.2011.6176352