Title :
Instrument related structure in covariance matrices used for uncertainty propagation
Author :
Humphreys, David A. ; Harris, Peter M. ; Miall, J.M.
Author_Institution :
Electromagn. Technol., Nat. Phys. Lab., Teddington, UK
Abstract :
We investigate the structure expected in covariance uncertainty matrices for real-time and sampling oscilloscopes with the aim of reducing the data storage requirements to scale proportional to the trace length (n) rather than n2. Simulation results indicate that the correlated and uncorrelated terms can be represented in a compact form. The implication of concatenated results, such as calibration and impedance match correction has been considered.
Keywords :
calibration; covariance matrices; impedance matching; measurement uncertainty; oscilloscopes; covariance matrices; impedance match correction; instrument related structure; real time oscilloscopes; sampling oscilloscopes; uncertainty propagation; Covariance matrices; Frequency-domain analysis; Oscilloscopes; Real-time systems; Standards; Uncertainty;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2302-4
Electronic_ISBN :
978-2-87487-026-2
