DocumentCode :
1648144
Title :
Signal integrity evaluation of a 10 Gbits/sec optoelectronic interconnect
Author :
Kahrs, M. ; Levitan, S.P. ; Chiarulli, Donald M. ; Kurzweg, T.P. ; Martinez, J.A. ; Boles, J. ; Davare, A.J. ; Jackson, E. ; Windish, C. ; Kiamilev, F. ; Bhaduri, A. ; Taufik, M. ; Xingle Wang ; Morris, A.S.I.I.I. ; Repke, J. ; Kruchowski, J. ; Gilbert, B
Author_Institution :
Dept. of Electr. Eng., Pittsburgh Univ., PA, USA
Volume :
2
fYear :
2003
Firstpage :
1211
Abstract :
Signal integrity is of vital importance to high speed interconnects. The 10G system is a 10 Gbit/second optical interconnect with a cross-section bandwidth of over 1T bit/second fabricated on a heterogeneous platform consisting of a multi-chip module, high-speed SiGe and GaAs opto-electronics. We compare lumped and multisegment microstrip models of the transmission lines on the MCM hybrid. We also model the wirebonds using a quasi-static model and a Co-Planar Waveguide (CPW) model for the bump bonds between the GaAs and SiGe substrates. These models are utilized by a behavioral simulator to demonstrate the effects of interconnect components on waveform shape. The results demonstrate convincingly that signal integrity is of critical importance to end-to-end performance measures at high transmission speeds and that incorporating these models is important to behavioral simulation.
Keywords :
Ge-Si alloys; gallium arsenide; integrated optoelectronics; lead bonding; microstrip lines; multichip modules; optical interconnections; smart pixels; transmission line theory; 10 Gbit/s; 10 Gbits/sec optoelectronic interconnect; 10G system; CPW model; GaAs; GaAs substrates; MCM hybrid; SiGe; SiGe substrates; behavioral simulator; bump bonds; cross-section bandwidth; end-to-end performance measures; heterogeneous platform; high speed interconnects; high transmission speeds; high-speed GaAs opto-electronics; high-speed SiGe opto-electronics; lumped microstrip models; multi-chip module; multisegment microstrip models; quasi-static model; signal integrity evaluation; smart pixel array; transmission lines; waveform shape; wirebond modeling; Bandwidth; Coplanar transmission lines; Coplanar waveguides; Gallium arsenide; Germanium silicon alloys; Microstrip; Optical interconnections; Optical waveguides; Shape; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1212586
Filename :
1212586
Link To Document :
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