• DocumentCode
    1648213
  • Title

    A new method for estimating the aperture uncertainty of A/D converters

  • Author

    Chiorboli, Giovanni ; Fontanili, Massimo ; Morandi, Carlo

  • Author_Institution
    Parma Univ., Italy
  • Volume
    1
  • fYear
    1997
  • Firstpage
    632
  • Abstract
    Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. An original method is here proposed which completely solves the difficulties arising from quantization and nonlinearity. The method estimates the noise distribution function by finely varying the input signal offset. The applicability of the method is proved by the experimental results obtained on 8 and 10 bit converters
  • Keywords
    analogue-digital conversion; integrated circuit measurement; integrated circuit noise; integrated circuit testing; A/D converters; aperture uncertainty; converter nonlinearity; input signal offset; noise distribution function; quantization; test setup noise; Additive noise; Apertures; Frequency; Jitter; Noise measurement; Phase noise; Quantization; Signal to noise ratio; Testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
  • Conference_Location
    Ottawa, Ont.
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-3747-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1997.604028
  • Filename
    604028
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1648213