Title :
A new method for estimating the aperture uncertainty of A/D converters
Author :
Chiorboli, Giovanni ; Fontanili, Massimo ; Morandi, Carlo
Author_Institution :
Parma Univ., Italy
Abstract :
Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. An original method is here proposed which completely solves the difficulties arising from quantization and nonlinearity. The method estimates the noise distribution function by finely varying the input signal offset. The applicability of the method is proved by the experimental results obtained on 8 and 10 bit converters
Keywords :
analogue-digital conversion; integrated circuit measurement; integrated circuit noise; integrated circuit testing; A/D converters; aperture uncertainty; converter nonlinearity; input signal offset; noise distribution function; quantization; test setup noise; Additive noise; Apertures; Frequency; Jitter; Noise measurement; Phase noise; Quantization; Signal to noise ratio; Testing; Uncertainty;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.604028
