DocumentCode :
1648240
Title :
Hyperspectral remote sensing subpixel object detection performance
Author :
Kerekes, John P.
Author_Institution :
Digital Imaging & Remote Sensing Lab., Rochester Inst. of Technol., Rochester, NY, USA
fYear :
2011
Firstpage :
1
Lastpage :
4
Abstract :
For nearly thirty years now, airborne and satellite hyperspectral imaging sensors have been used to collect high spatial resolution (1-30 meter) imagery of the earth´s surface in hundreds of co-registered, contiguous spectral channels. These data have been shown to enable the detection of objects smaller than a pixel due to the spectral information present. However, it is not always obvious beforehand if a given object will be detectable in a given scene, as performance has been observed to depend on many factors including illumination conditions, scene spectral complexity, target variability, sensor artifacts as well as algorithm variations. Over the past fifteen years our research has been exploring ways to predict and assess performance of hyperspectral subpixel detection. Our methods have included analytical modeling tools, empirical blind tests, and quality metrics for spectral imagery. Results of this work have confirmed the feasibility of hyperspectral subpixel objection detection and have provided tools for quantification of the performance.
Keywords :
geophysical image processing; object detection; remote sensing; Earth´s surface; airborne hyperspectral imaging; algorithm variation; analytical modeling tool; empirical blind test; hyperspectral remote sensing; hyperspectral subpixel detection; illumination condition; imaging sensor; quality metric; satellite hyperspectral imaging; scene spectral complexity; sensor artifact; spectral channel; spectral information; subpixel object detection performance; target variability; Analytical models; Hyperspectral imaging; Imaging; Object detection; Sensors; hyperspectral; sensing performance; target detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Imagery Pattern Recognition Workshop (AIPR), 2011 IEEE
Conference_Location :
Washington, DC
ISSN :
1550-5219
Print_ISBN :
978-1-4673-0215-9
Type :
conf
DOI :
10.1109/AIPR.2011.6176366
Filename :
6176366
Link To Document :
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