DocumentCode :
1648393
Title :
Polychronous Methodology For System Design: A True Concurrency Approach
Author :
Suhaib, Syed ; Mathaikutty, Deepak ; Shukla, Satyavati ; Talpin, Jean-Pierre
Author_Institution :
FERMAT Lab., Virginia Tech, Blacksburg, VA
fYear :
2006
Firstpage :
211
Lastpage :
214
Abstract :
As embedded systems have become pervasive and ubiquitous in contemporary technologies, their development requires highly reliable design approaches. One of these approaches is the so-called synchronous programming paradigm, where its mathematical basis provides the required formal concepts to satisfy correctness expectations. Among these synchronous programming concepts, the multi-clocked model of computation of polychrony stands out for its capability to give high-level and homogeneous descriptions of concurrent systems, where its concurrent parts may evolve asynchronously to each other and synchronize intermittently. In this paper, we propose a ´true concurrency´ semantic model of polychrony using pomsets. This formulation of polychrony closes the gap between synchrony and asynchrony by giving a uniform characterization of both synchronous and asynchronous observations by considering the causality and functional dependency structure of a pomset. The results in this paper also show that the existing tagged-signal model for polychrony uses an unnecessary artifact namely, tags, which complicate the semantic theory unduly
Keywords :
concurrency theory; embedded systems; program verification; set theory; synchronisation; systems analysis; embedded systems design; functional dependency structure; mathematical basis; multiclocked polychrony computation model; polychronous system design; pomsets; synchronous programming; true concurrency semantic model; Computational modeling; Computer networks; Concurrent computing; Conferences; Embedded system; Mathematical programming; Processor scheduling; Synchronization; System testing; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International
Conference_Location :
Monterey, CA
ISSN :
1552-6674
Print_ISBN :
1-4244-0679-X
Electronic_ISBN :
1552-6674
Type :
conf
DOI :
10.1109/HLDVT.2006.319993
Filename :
4110092
Link To Document :
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