Title :
Macro Testability; The Results of Production Device Applications
Author :
Bouwman, Frank ; Oostdijk, Steven ; Stans, Rudi ; Bennetts, Ben ; Beenker, Frans
Keywords :
Application software; Assembly; Integrated circuit testing; Laboratories; Logic design; Logic devices; Production; Software testing; Software tools; Very large scale integration;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527824
