Title : 
Millimeter-wave MMIC switches with pHEMT cells reduced parasitic inductance
         
        
            Author : 
Tsukahara, Y. ; Katoh, T. ; Notani, Y. ; Ishida, T. ; Ishikawa, T. ; Komaru, M. ; Matsuda, Y.
         
        
            Author_Institution : 
High Frequency & Opt. Semicond. Div., Mitsubishi Electr. Corp., Hyogo, Japan
         
        
        
        
        
            Abstract : 
High isolation millimeter-wave switches have been successfully developed using a newly developed line unified shunt pHEMT structure, which is effective to reduce parasitic inductance of its short circuit. The developed V-band SPDT switch shows an isolation of greater than 40 dB and an insertion loss of 1.8 dB at 60 GHz, and the W-band SP3T switch shows an isolation of greater than 35 dB and an insertion loss of 2.5 dB at 77 GHz. Input and output return losses are better than 12 dB in ON-state. These performances of high isolation and low insertion loss are the best among V-band and W-band pHEMT MMIC switches. The switches consume no DC power, and require no complex off-chip bias circuitry.
         
        
            Keywords : 
HEMT integrated circuits; field effect MMIC; inductance; microwave switches; 1.8 dB; 12 dB; 2.5 dB; 60 GHz; 77 GHz; V band SPDT switch; W-band SP3T switch; insertion loss; isolation; line unified shunt pHEMT structure; millimeter-wave MMIC switch; parasitic inductance; return loss; Electrodes; FETs; Frequency; Inductance; Insertion loss; MMICs; Millimeter wave circuits; Optical switches; PHEMTs; Switching circuits;
         
        
        
        
            Conference_Titel : 
Microwave Symposium Digest, 2003 IEEE MTT-S International
         
        
            Conference_Location : 
Philadelphia, PA, USA
         
        
        
            Print_ISBN : 
0-7803-7695-1
         
        
        
            DOI : 
10.1109/MWSYM.2003.1212607