• DocumentCode
    1648837
  • Title

    CMRF special session: Compact models for RF-microwave applications

  • Author

    Van der Toorn, Ramses

  • Author_Institution
    TU Delft, The Netherlands
  • fYear
    2010
  • Abstract
    The CMRF 2010 will explore the theme “TCAD Meets Compact Modeling”. Device simulations (TCAD) and Compact Modeling (CM) are complementary. Both serve device characterization. TCAD-based physical insight may provide a basis for physics-based compact model development. TCAD and CM can be combined to predict device and even circuit performance in future technologies. Compact model parameter extraction can be supported from TCAD.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010 IEEE
  • Conference_Location
    Austin, TX, USA
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4244-8578-9
  • Type

    conf

  • DOI
    10.1109/BIPOL.2010.5668093
  • Filename
    5668093
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1648837