• DocumentCode
    1649096
  • Title

    Accelerating High-level Bounded Model Checking

  • Author

    Ganai, Malay K. ; Gupta, Aarti

  • Author_Institution
    NEC Labs. America, Princeton, NJ
  • fYear
    2006
  • Firstpage
    794
  • Lastpage
    801
  • Abstract
    SAT-based bounded model checking (BMC) has been found promising in finding deep bugs in industry designs and scaling well with design sizes. However, it has limitations due to requirement of finite data paths, inefficient translations and loss of high-level design information during the BMC problem formulation. These shortcomings inherent in Boolean-level BMC can be avoided by using high-level BMC. We propose a novel framework for high-level BMC, which includes several techniques that extract high-level design information from EFSM models to make the verification model "BMC friendly", and use it on-the-fly to simplify the BMC problem instances. Such techniques overcome the inherent limitations of Boolean-level BMC, while allowing integration of state-of-the-art techniques for BMC. In our controlled experiments we found significant performance improvements achievable by the proposed techniques
  • Keywords
    computability; formal verification; SAT-based bounded model checking; high-level bounded model checking; high-level design; Acceleration; Boolean functions; Circuit synthesis; Computer bugs; Data mining; Data structures; Laboratories; National electric code; Permission; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    1-59593-389-1
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2006.320122
  • Filename
    4110124