DocumentCode
1649096
Title
Accelerating High-level Bounded Model Checking
Author
Ganai, Malay K. ; Gupta, Aarti
Author_Institution
NEC Labs. America, Princeton, NJ
fYear
2006
Firstpage
794
Lastpage
801
Abstract
SAT-based bounded model checking (BMC) has been found promising in finding deep bugs in industry designs and scaling well with design sizes. However, it has limitations due to requirement of finite data paths, inefficient translations and loss of high-level design information during the BMC problem formulation. These shortcomings inherent in Boolean-level BMC can be avoided by using high-level BMC. We propose a novel framework for high-level BMC, which includes several techniques that extract high-level design information from EFSM models to make the verification model "BMC friendly", and use it on-the-fly to simplify the BMC problem instances. Such techniques overcome the inherent limitations of Boolean-level BMC, while allowing integration of state-of-the-art techniques for BMC. In our controlled experiments we found significant performance improvements achievable by the proposed techniques
Keywords
computability; formal verification; SAT-based bounded model checking; high-level bounded model checking; high-level design; Acceleration; Boolean functions; Circuit synthesis; Computer bugs; Data mining; Data structures; Laboratories; National electric code; Permission; Surface-mount technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
1-59593-389-1
Electronic_ISBN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2006.320122
Filename
4110124
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