Title :
Design of a 4.2-5.4 GHz Differential LC VCO using 0.35 μm SiGe BiCMOS Technology
Author :
Esame, O. ; Tekin, I. ; Gurbuz, Yasar ; Bozkurt, A.
Author_Institution :
Sabanci Univ., Istanbul
Abstract :
In this paper, a 4.2-5.4 GHz, -Gm LC voltage controlled oscillator (VCO) for IEEE 802.11a standard is presented. The circuit is designed with AMS 0.35 mum SiGe BiCMOS process that includes high-speed SiGe heterojunction bipolar transistors (HBTs). Phase noise is -110.7 dBc/Hz at 1MHz offset from 5.4 GHz carrier frequency and -113.5 dBc/Hz from 4.2 GHz carrier frequency. A linear, 1200 MHz tuning range is obtained utilizing accumulation-mode varactors. Phase noise is relatively low due to taking the advantage of differential tuning concept. Output power of the fundamental frequency changes between 4.8 dBm and 5.5 dBm depending on the tuning voltage. The circuit draws 2 mA without buffers and 14.5 mA from 2.5 V supply including buffer circuits leading to a total power dissipation of 36.25 mW. The circuit occupies an area of 0.6 mm2 on Si substrate including RF and DC pads.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; IEEE standards; bipolar transistor circuits; buffer circuits; circuit noise; circuit tuning; heterojunction bipolar transistors; microwave oscillators; phase noise; silicon; varactors; voltage-controlled oscillators; IEEE 802.11a standard; Si; SiGe; SiGe BiCMOS technology; SiGe HBT; SiGe heterojunction bipolar transistors; accumulation-mode varactors; buffer circuits; current 14.5 mA; current 2 mA; differential LC VCO; differential tuning concept; frequency 1200 MHz; frequency 4.2 GHz to 5.4 GHz; phase noise; power 36.25 mW; power dissipation; size 0.35 mum; voltage 2.5 V; voltage controlled oscillator; BiCMOS integrated circuits; Circuit optimization; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Phase noise; Silicon germanium; Tuning; Varactors; Voltage-controlled oscillators; Differential tuning; RFIC; SiGe BiCMOS; VCO; WLAN;
Conference_Titel :
Sarnoff Symposium, 2006 IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
978-1-4244-0002-7
DOI :
10.1109/SARNOF.2006.4534780