• DocumentCode
    1649455
  • Title

    New analysis methods for comprehensive understanding of Random Telegraph Noise

  • Author

    Nagumo, T. ; Takeuchi, K. ; Yokogawa, S. ; Imai, K. ; Hayashi, Y.

  • Author_Institution
    LSI Fundamental Res. Lab., NEC Electron. Corp., Sagamihara, Japan
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    New analysis methods useful for understanding both complex waveforms and statistical behaviors of Random Telegraph Noise (RTN) are proposed. Complex waveforms are clearly visualized using Time Lag Plots. Bias dependence of statistically extracted average trap number is discussed, with emphasis on the importance of undetectable traps on product reliability.
  • Keywords
    delays; random noise; reliability; statistical analysis; telegraphy; complex waveforms; product reliability; random telegraph noise; statistical behaviors; statistically extracted average trap number; time lag plots; Current measurement; Fluctuations; Intrusion detection; Random access memory; Sampling methods; Statistical distributions; Switches; Telegraphy; Testing; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2009 IEEE International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4244-5639-0
  • Electronic_ISBN
    978-1-4244-5640-6
  • Type

    conf

  • DOI
    10.1109/IEDM.2009.5424230
  • Filename
    5424230
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1649455