• DocumentCode
    1649485
  • Title

    Extraction of the effect and the technology terms from a patent document

  • Author

    Nonaka, Hirofumi ; Kobayahi, Akio ; Sakaji, Hiroki ; Suzuki, Yusuke ; Sakai, Hiroyuki ; Masuyama, Shigeru

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Toyohashi Univ. of Technol., Toyohashi, Japan
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A patent map, a visual representation of related patent information, is an effective strategic tool for analysis of patent application trends. In particular, an effect-technology type patent map is commonly used as patent examinations are based on technology and effect terms of the inventions. However, conventional patent mining tools are not realized to make an effect-technology type patent map. In order to generate effect-technology type patent maps automatically, we propose a method for extracting information on the effect and the technological terms from patent documents. Our proposed method is described by the following steps. (Step 1) Extract expressions containing the information on the technical effect by using frequent expressions and clue expressions that are automatically extracted by using statistical information and initial clue expressions. (Step 2) Extract technology terms in the above expressions by character-string comparison between patent claims and the expressions. (Step 3) Extract effect terms using grammar patterns that are composed of technology terms, frequent expressions and clue expressions. Our method achieves high precision (85.0%) by using frequent expressions, clue expressions, and the grammar patterns.
  • Keywords
    data mining; document handling; grammars; information analysis; patents; statistical analysis; character-string comparison; conventional patent mining tools; effect-technology type patent map; extract technology; frequent expressions; grammar patterns; information extraction; initial clue expressions; patent application; patent claims; patent document; patent examinations; patent expressions; related patent information; statistical information; visual representation; Art; Compounds; Data mining; Entropy; Grammar; Patents; Technological innovation; effect-technology type patent map; extraction of effect terms; extraction of technology terms; text-mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Industrial Engineering (CIE), 2010 40th International Conference on
  • Conference_Location
    Awaji
  • Print_ISBN
    978-1-4244-7295-6
  • Type

    conf

  • DOI
    10.1109/ICCIE.2010.5668167
  • Filename
    5668167