DocumentCode
1649487
Title
Combined analysis of systematic and random uncertainties for different noise-figure characterization methodologies
Author
Collado, A. ; Collantes, J.M. ; de la Fuente, L. ; Otegi, N. ; Perea, L. ; Sayed, M.
Author_Institution
Electricity & Electron. Dept., Univ. of the Basque Country, Bilbao, Spain
Volume
2
fYear
2003
Firstpage
1419
Abstract
This paper presents a simulation tool for the rigorous analysis of the final uncertainty associated to different methodologies for noise figure characterization. The simulation tool permits the analysis of the combined effect of systematic errors and underlying uncertainties versus any significant characteristic of the DUT or measurement setup. Some application examples are presented showing the suitability of the proposed approach to determine the most efficient characterization methodology for a given DUT and measurement setup.
Keywords
electric noise measurement; measurement errors; measurement uncertainty; device under test; measurement error; noise figure; random uncertainty; simulation tool; systematic uncertainty; Acoustic reflection; Analytical models; Circuits; Error correction; Noise figure; Noise measurement; Scattering parameters; Temperature; Time measurement; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location
Philadelphia, PA, USA
ISSN
0149-645X
Print_ISBN
0-7803-7695-1
Type
conf
DOI
10.1109/MWSYM.2003.1212638
Filename
1212638
Link To Document