• DocumentCode
    1649745
  • Title

    Application of wire dynamics models to nested array implosions on Z

  • Author

    Terry, Robert E. ; Clark, R.W. ; Davis, J. ; Velikovich, A.L. ; Orens, J.H.

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • fYear
    1998
  • Firstpage
    267
  • Abstract
    Summary form only given. A practical wire dynamical model (WDM) treats the individual wire segments of an array load as a self-consistent electrical and mechanical ensemble. From a mechanical viewpoint the segments are mutually interacting particles driven by Biot-Savart force to attract or repel one another according to the currents each carries. Electrically, the segments are viewed as mutually inductive circuit elements that remain connected in parallel to the driving circuit but are otherwise free to move about the solution domain and free to partition the input current among all the parallel paths. Complete electrical and mechanical self-consistency is an absolute requirement for the accurate modeling of an experiment. In the particular WDM used here, extensive use is made of rotational symmetry to exploit existing experimental geometries, minimize the number of floating point operations, and introduce regular initial perturbations for stability studies. The model is also amenable to several wire-to-wire collision models, as well as wire heating and expansion models, which will be discussed. The model was applied to detailed models of nested array loads recently investigated with the Z driver at Sandia National Laboratory.
  • Keywords
    exploding wires; Biot-Savart force; Z; Z driver; array load; driving circuit; electrical ensemble; electrical self-consistency; floating point operations; mechanical ensemble; mechanical self-consistency; modeling; mutually inductive circuit elements; mutually interacting particles; nested array implosions; nested array loads; regular initial perturbations; rotational symmetry; solution domain; wire dynamics models; wire-to-wire collision models; Circuit simulation; Computational modeling; Driver circuits; Geometry; Heating; Laboratories; Stability; Voltage; Wavelength division multiplexing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
  • Conference_Location
    Raleigh, NC, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-4792-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.1998.677836
  • Filename
    677836