• DocumentCode
    1649776
  • Title

    Impacts of TFT-LCD polarity, font size and line space on visual performance with age-difference considerations

  • Author

    Lin, Dyi-Yih Michael ; Yeh, Li-Chi

  • Author_Institution
    Dept. of Ind. Eng. & Manage., I-Shou Univ., Kaohsiung, Taiwan
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The purpose of the present study is to investigate older adults´ visual fatigue and performance in the use of Thin Film Transistor Liquid Crystal Display (TFT-LCD). An experiment where age (older vs. young) and display polarity (positive vs. negative) were manipulated as factors was first conducted to determine the optimal display background. In the first experiment, visual fatigue was measured by critical flicker fusion (CFF) and visual performance was measured by the searching hit rate. The results showed that the negative polarity resulted in less fatigue for CFF and searching hit rate, particularly for the older subject. A subsequent experiment with all test materials displayed in negative polarity followed where age (old vs. young), font size (12 vs. 14 points), and interline spacing (single vs. double) were designed as the factors. ANOVA found a significant interaction, which indicated that the combination of 14-point font and double interline space resulted in the best visual search performance, with the effect particularly pronounced for the older subject than for the younger counterpart. Implications for the design of TFT-LCD with age considerations were discussed in details.
  • Keywords
    liquid crystal displays; thin film transistors; TFT-LCD polarity; age-difference considerations; critical flicker fusion; font size; line space; searching hit rate; thin film transistor liquid crystal display; visual fatigue; visual performance; Computers; Ergonomics; Fatigue; Human factors; Materials; Thin film transistors; Visualization; TFT-LCD; display design; display polarity; older adults; visual performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Industrial Engineering (CIE), 2010 40th International Conference on
  • Conference_Location
    Awaji
  • Print_ISBN
    978-1-4244-7295-6
  • Type

    conf

  • DOI
    10.1109/ICCIE.2010.5668179
  • Filename
    5668179