Title :
Avoiding Denial of Service via Stress Testing
Author :
Abu-Nimeh, Saeed ; Nair, Suku ; Marchetti, Marco
fDate :
3/8/2006 12:00:00 AM
Keywords :
Bandwidth; Computer crime; Delay; Government; Network servers; Performance evaluation; Semiconductor device testing; Stress measurement; Time factors; Web server;
Conference_Titel :
Computer Systems and Applications, 2006. IEEE International Conference on.
Print_ISBN :
1-4244-0211-5
DOI :
10.1109/AICCSA.2006.205105