Title :
Experimental evaluation of a parallel blind demodulator combined with a Reed-Solomon decoder in the presence of intersymbol interference
Author :
Tanada, Kazuo ; Kubo, Hiroshi ; Okazaki, Akihiro ; Uraguchi, Takeshi ; Hayashi, Shuichi ; Ishikawa, Hisashi ; Iwase, Atsushi ; Taniguchi, Jun
Author_Institution :
Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Japan
fDate :
6/23/1905 12:00:00 AM
Abstract :
This paper evaluates a parallel blind demodulator combined with a Reed-Solomon (RS) decoder in the presence of intersymbol interference (ISI) by means of hardware experiments. Our target systems are point to multi-point (P-MP) communication systems for business use, of which bit rates in the air are 9.6 kbit/s. In such narrow frequency band systems, fast time-varying fading is a serious problem. The implemented parallel blind demodulator employs adaptive maximum-likelihood sequence estimation with per-survivor processing (PSP-MLSE), and the RS code is used for a forward error correction (FEC) code. Finally, experimental results confirm that the parallel blind demodulator combined with the RS decoder achieves excellent BER performance
Keywords :
Reed-Solomon codes; adaptive decoding; adaptive equalisers; blind equalisers; business communication; demodulators; fading channels; forward error correction; intersymbol interference; maximum likelihood sequence estimation; time-varying channels; 9.6 kbit/s; BER performance; FEC code; ISI; P-MP communication; RS code; RS decoder; Reed-Solomon decoder; adaptive PSP-MLSE; adaptive equalization; business use; fast time-varying fading; forward error correction; intersymbol interference; maximum-likelihood sequence estimation; narrow frequency band systems; parallel blind demodulator; per survivor processing; point to multi-point communication; Bit rate; Business communication; Demodulation; Forward error correction; Frequency; Hardware; Intersymbol interference; Maximum likelihood decoding; Reed-Solomon codes; Time varying systems;
Conference_Titel :
Vehicular Technology Conference, 2001. VTC 2001 Fall. IEEE VTS 54th
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-7005-8
DOI :
10.1109/VTC.2001.957170
