DocumentCode :
1650059
Title :
H-functions and BER analysis of FFH/BFSK with product combining over partial-band jammed Rayleigh fading channels
Author :
Huo, Gang ; Alouini, Klohamed-Slim
Author_Institution :
LSI Logic Corp., Bloomington, MN, USA
Volume :
4
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
2374
Abstract :
Product combining (PC) is a well known diversity technique that effectively combats the effect of partial-band jamming (PBJ) affecting fast-frequency-hopping/frequency-shift-keying systems. We rely on the theory of H-function random variables to present an approach for the average BER evaluation of PC over partial-band jammed Rayleigh fading channels. The final closed-form formula is expressed in terms of the Meijer G-function, which can be easily evaluated using common mathematical software for small values of the diversity order. Based on this result we also develop an infinite series representation for the average BER. Numerical experiments show that the latter series representation offers a speed-up factor in evaluating the average BER especially for high values of the diversity order. The mathematical formalism is illustrated by some numerical examples showing the effect of various parameters on the performance of the system
Keywords :
Rayleigh channels; diversity reception; error statistics; frequency hop communication; frequency shift keying; jamming; packet radio networks; series (mathematics); BER analysis; FFH/BFSK; H-functions; Meijer G-function; Rayleigh fading channels; average BER evaluation; diversity order; fast-frequency-hopping/frequency-shift-keying systems; infinite series representation; partial-band jamming; performance; product combining; random variables; speed-up factor; wireless ad-hoc networks; Bit error rate; Closed-form solution; Diversity reception; Fading; Frequency diversity; Frequency shift keying; Jamming; Military communication; Random variables; Rayleigh channels;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference, 2001. VTC 2001 Fall. IEEE VTS 54th
Conference_Location :
Atlantic City, NJ
ISSN :
1090-3038
Print_ISBN :
0-7803-7005-8
Type :
conf
DOI :
10.1109/VTC.2001.957174
Filename :
957174
Link To Document :
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